MICROTEST 7750 Impulse Winding Tester

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MICROTEST

MICROTEST 7750 Impulse Winding Tester

MICROTEST 7750 Impulse Winding Tester Features Lowest Inductance (≥0.1μH) High voltage calibration programmable impulse voltage 200MHz/9bit High Impulse Test Sampling Rate Total Area Comparison Differential Area Comparison Corona Comparison LAPLACIAN Comparison Voltage Compensation Function Specifications Selection Model 7750-1 7750-5 7750-10 Test Channel single channel Impulse Voltage 10V-1200V 100V-5200V 200V-10000V Lowest Inductance ≥0.1μH ≥10μH ≥20μH Voltage Resolution 0.1V 1V 5V Voltage Accuracy ±(1% of setting + 5V) ±(1% of setting + 10V) ±(1% of setting + 20V) Pulse Energy 0.028 joule 0...

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MICROTEST 7750 Impulse Winding Tester

Features

  • Lowest Inductance (≥0.1μH)
  • High voltage calibration
  • programmable impulse voltage
  • 200MHz/9bit  High Impulse Test Sampling Rate
  • Total Area Comparison
  • Differential Area Comparison
  • Corona  Comparison
  • LAPLACIAN Comparison
  • Voltage Compensation Function

Specifications

Selection

Model

7750-1

7750-5

7750-10

Test Channel

single channel

Impulse Voltage

10V-1200V

100V-5200V

200V-10000V

Lowest Inductance

≥0.1μH

≥10μH

≥20μH

Voltage Resolution

0.1V

1V

5V

Voltage Accuracy

±(1% of setting + 5V)

±(1% of setting + 10V)

±(1% of setting + 20V)

Pulse Energy

0.028 joule

0.5 joule

2 joule

SPEC

Model

7750

Sampling Rate

200MHz/9 bit

Pulse Number

Max. 32

Input Impedance

20MΩ

Measurement Statistics

Breakdown Voltage

Measurement Time

7 times/second

Provides 4 waveform comparison

Total area comparison

When layer short happened, the loss of power on coil increase, the resonance damping coefficient increase, resonance amplitude decrease, the total area decrease. These are the basic parameters we check layer short.

By calculating and comparing the deference of area between golden sample and DUT.

Show by percentage

Analysis the power loss by this data.

Differential area comparison

Add up the difference between normal wave and DUT wave call “ Area differential”.

When layer short happened, the inductance reduce(similar the transformer). The wave phase change and the area differential also change. This will show “fail” on the instrument.

However, the parameter might cause deviation because of the deviation of inductance, resonance phase shift. (Silicon steel product such as motor and traditional transformer is not suitable)

By calculating and comparing the deference of area between golden sample and DUT. To determine the degree of waveform overlap.

Compare the inductance by this.

Corona comparison

In pulse test, the insulation defect will cause discharge and create corona. This function is able to count the times that corona happened base on the degree of deviation.

Detect the discharge phenomenon on the coil.

LAPLACIAN Comparison

Use the second derivative to calculate the Laplacian value.

By the corona waveform of high-frequency to know more about the insulating property of products.

SYSTEM

PLC Remote Control

Test、About

PLC Remote Output Signal

PASS、FAIL、HV Output、Testing

Built-in Storage

200 sets testing waveform

Power Supply

Voltage:98Vac-132Vac 或192Vac-264Vac

Frequency:50/60Hz ±5%

Power consumption

300VA

Environment

Temperature:10℃-40℃

Humidity:20-90%RH

Dimension

435x145x522 mm (W*H*D)

Weight

8 Kg

Interface

RS-232、Remote、Printer

Display

5.7" dot-matrix (300*240 )